Erweiterte Suche

Grid  List

  1. ESD Protection Device and Circuit Design for Advanced CMOS Technologies ESD Protection Device and Circuit Design for Advanced CMOS Technologies

    ESD Protection Device and Circuit Design for Advanced CMOS Technologies

    Oleg Semenov
    Springer Netherlands, Springer Netherlands
    19.10.2010

    ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicin...

    Taschenbuch
    181,89 €
    Print on Demand
    Alle Preise inkl. MwSt | Versandkostenfrei
  2. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

    CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

    Manoj Sachdev
    Springer Netherlands, Springer
    28.10.2010

    CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of ...

    Taschenbuch
    171,19 €
    Print on Demand
    Alle Preise inkl. MwSt | Versandkostenfrei
  3. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    José Pineda de Gyvez
    Springer US, Humana
    10.11.2010

    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

    Taschenbuch
    213,99 €
    Print on Demand
    Alle Preise inkl. MwSt | Versandkostenfrei
  4. Esd Protection Device and Circuit Design for Advanced CMOS Technologies Esd Protection Device and Circuit Design for Advanced CMOS Technologies

    Esd Protection Device and Circuit Design for Advanced CMOS Technologies

    Oleg Semenov
    Springer
    06.05.2008

    ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicin...

    Gebunden

    Unser bisheriger Preis:ORGPRICE: 181,89 €

    Jetzt 171,19 €
    Print on Demand
    Alle Preise inkl. MwSt | Versandkostenfrei
  5. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    José Pineda de Gyvez
    Springer US, Springer
    21.06.2007

    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

    Gebunden
    213,99 €
    Print on Demand
    Alle Preise inkl. MwSt | Versandkostenfrei
  6. Thermal and Power Management of Integrated Circuits Thermal and Power Management of Integrated Circuits

    Thermal and Power Management of Integrated Circuits

    Arman Vassighi
    Springer, Springer
    29.11.2010

    In Thermal and Power Management of Integrated Circuits, power and thermal management issues in in...

    Taschenbuch
    106,99 €
    Print on Demand
    Alle Preise inkl. MwSt | Versandkostenfrei
  7. CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies

    CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies

    Andrei Pavlov
    Springer
    21.06.2008

    CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of ...

    Gebunden

    Unser bisheriger Preis:ORGPRICE: 171,19 €

    Jetzt 160,49 €
    Besorgungstitel - wird vorgemerkt
    Alle Preise inkl. MwSt | Versandkostenfrei
  8. Thermal and Power Management of Integrated Circuits Thermal and Power Management of Integrated Circuits

    Thermal and Power Management of Integrated Circuits

    Arman Vassighi
    Springer Us
    04.01.2006

    In Thermal and Power Management of Integrated Circuits, power and thermal management issues in in...

    Gebunden
    106,99 €
    Besorgungstitel - wird vorgemerkt
    Alle Preise inkl. MwSt | Versandkostenfrei
  1. 1